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Journal description
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Details for article 10 of 21 found articles
| Title: |
Improvement of negative bias temperature instability of LTPS TFTs by high pressure H2O annealing |
| Author: |
Kim, Soonkon Kim, Hyojung Kim, Kihwan Choi, Pyungho Choi, Byoungdeog |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 116 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 10 of 21 found articles
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