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Journal description
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Details for article 93 of 175 found articles
| Title: |
IGBT aging monitoring and remaining lifetime prediction based on long short-term memory (LSTM) networks |
| Author: |
Li, Wanping Wang, Bixuan Liu, Jingcun Zhang, Guogang Wang, Jianhua |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 114 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 93 of 175 found articles
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