|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 83 of 175 found articles
| Title: |
Gate-damage accumulation and off-line recovery in SiC power MOSFETs with soft short-circuit failure mode |
| Author: |
Castellazzi, A. Richardeau, F. Borghese, A. Boige, F. Fayyaz, A. Irace, A. Guibaud, G. Chazal, V. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 114 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 83 of 175 found articles
| << previous | next >> |