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Journal description
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Details for article 4 of 175 found articles
| Title: |
AC stress reliability study on a novel vertical MOS transistor for non-volatile memory technology |
| Author: |
Locati, J. Della Marca, V. Rivero, C. Fornara, P. Regnier, A. Niel, S. Coulié, K. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 114 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 175 found articles
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