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Details for article 19 of 175 found articles
| Title: |
Analysis of the successive breakdown statistics of multilayer Al2O3/HfO2 gate stacks using the time-dependent clustering model |
| Author: |
Muñoz-Gorriz, J. Gonzalez, M.B. Campabadal, F. Suñé, J. Miranda, E. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 114 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 19 of 175 found articles
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