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Journal description
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Details for article 138 of 175 found articles
| Title: |
Profiling of carriers in a 3D flash memory cell with nanometer-level resolution using scanning nonlinear dielectric microscopy |
| Author: |
Hirota, J. Yamasue, K. Cho, Y. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 114 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 138 of 175 found articles
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