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Journal description
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Details for article 127 of 175 found articles
| Title: |
OFF-state trapping phenomena in GaN HEMTs: Interplay between gate trapping, acceptor ionization and positive charge redistribution |
| Author: |
Canato, E. Meneghini, M. De Santi, C. Masin, F. Stockman, A. Moens, P. Zanoni, E. Meneghesso, G. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 114 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 127 of 175 found articles
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