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Journal description
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Details for article 9 of 14 found articles
| Title: |
Extended symbol correction algorithm for group testing based non-binary error correction codes of minimum distance d q < 5 |
| Author: |
Garcia-Herrero, F. Sánchez-Macián, A. Maestro, J.A. Flanagan, M.F. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 113 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 9 of 14 found articles
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