|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 5 of 14 found articles
| Title: |
Correlation between OCVD carrier lifetime vs temperature measurements and reverse recovery behavior of the body diode of SiC power MOSFETs |
| Author: |
Sapienza, S. Sozzi, G. Santoro, D. Cova, P. Delmonte, N. Verrini, G. Chiorboli, G. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 113 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 14 found articles
| << previous | next >> |