|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 115 of 131 found articles
| Title: |
The distribution of mobile carriers in the pinch-off region of an insulated-gate field-effect transistor and its influence on device breakdown |
| Author: | |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 11 (1972) nr. 1 pages 1 p. |
| Year: |
1972 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 115 of 131 found articles
| << previous | next >> |