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Journal description
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Details for article 4 of 12 found articles
| Title: |
Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors |
| Author: |
Simicic, Marko Ashif, Nowab Reza Hellings, Geert Chen, Shih-Hung Nag, Manoj Kronemeijer, Auke Jisk Myny, Kris Linten, Dimitri |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 108 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 4 of 12 found articles
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