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Journal description
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Details for article 13 of 25 found articles
| Title: |
Evaluation of ISO 26262 and IEC 61508 metrics for transient faults of a multi-processor system-on-chip through radiation testing |
| Author: |
Ballan, Oscar Maillard, Pierre Arver, Jue Smith, Christina Petersson, Roland Griessing, Alexander Venini, Federico |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 107 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 25 found articles
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