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Journal description
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Details for article 5 of 25 found articles
| Title: |
Degradation in electrothermal characteristics of 4H-SiC junction barrier Schottky diodes under high temperature power cycling stress |
| Author: |
Tang, Yidan Ge, Lan Gu, Hang Bai, Yun Luo, Yafei Li, Chengzhan Liu, Xinyu |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 102 (2019) nr. C pages p. |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 25 found articles
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