|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 17 of 25 found articles
| Title: |
Random vibration fatigue life analysis of electronic packages by analytical solutions and Taguchi method |
| Author: |
Gharaibeh, Mohammad A. Pitarresi, James M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 102 (2019) nr. C pages p. |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 25 found articles
| << previous | next >> |