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Journal description
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Details for article 12 of 25 found articles
| Title: |
Investigating the latent reliability degradation of partially depleted SOI devices induced by high-energy heavy ions irradiation |
| Author: |
Ma, Teng Yu, Xuefeng Paccagnella, Alessandro Guo, Qi |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 102 (2019) nr. C pages p. |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 12 of 25 found articles
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