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Details for article 23 of 25 found articles
| Title: |
Thermal performance analysis of GaN nanowire and fin-shaped power transistors based on self-consistent electrothermal simulations |
| Author: |
Kamrani, Hamed Yu, Feng Frank, Kristian Strempel, Klaas Fatahilah, Muhammad Fahlesa Wasisto, Hutomo Suryo Römer, Friedhard Waag, Andreas Witzigmann, Bernd |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 91 (2018) nr. P2 pages 227-231 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 23 of 25 found articles
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