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Journal description
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Details for article 13 of 21 found articles
| Title: |
Performance analysis of S-parameter in N-MOSFET devices after thermal accelerated tests |
| Author: |
Belaïd, M.A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 91 (2018) nr. P1 pages 8-14 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 13 of 21 found articles
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