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Details for article 966 of 2999 found articles
| Title: |
Effect of interface traps for ultra-thin high-k gate dielectric based MIS devices on the capacitance-voltage characteristics |
| Author: |
Hlali, Slah Hizem, Neila Militaru, Liviu Kalboussi, Adel Souifi, Abdelkader |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 75 (2017) nr. C pages 154-161 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 966 of 2999 found articles
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