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Journal description
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Details for article 707 of 2999 found articles
| Title: |
Degradation of GaN-on-GaN vertical diodes submitted to high current stress |
| Author: |
Fabris, E. Meneghini, M. De Santi, C. Hu, Z. Li, W. Nomoto, K. Gao, X. Jena, D. Xing, H.G. Meneghesso, G. Zanoni, E. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 88-90 (2018) nr. C pages 568-571 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
The Authors |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 707 of 2999 found articles
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