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Details for article 660 of 2999 found articles
| Title: |
Cryogenic-temperature investigation of negative bias stress inducing threshold voltage instabilities on 4H-SiC MOSFETs |
| Author: |
Masin, F. De Santi, C. Lettens, J. Geenen, F. Meneghesso, G. Zanoni, E. Moens, P. Meneghini, M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 138 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 660 of 2999 found articles
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