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Journal description
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Details for article 586 of 2989 found articles
| Title: |
Comprehensive separate extraction of parasitic resistances in MOSFETs considering the gate bias-dependence and the asymmetric overlap length |
| Author: |
Kim, Junyeap Yoo, Hanbin Lee, Heesung Kim, Seong Kwang Choi, Sungju Choi, Sung-Jin Kim, Dae Hwan Kim, Dong Myong |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 85 (2018) nr. C pages 66-70 |
| Year: |
2018 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 586 of 2989 found articles
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