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Journal description
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Details for article 497 of 2989 found articles
| Title: |
Characterization of a novel radiation hardened by design (RHD14) bit-cell based on 20-nm FinFET technology using TCAD simulations |
| Author: |
Limachia, Mitesh J. Thakker, Rajesh Kothari, Nikhil |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 142 () nr. C pages p. |
| Year: |
2023 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 497 of 2989 found articles
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