Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 474 of 2989 found articles
 
 
  Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters
 
 
Title: Calculation of single event burnout failure rate for high voltage devices under satellite orbit without fitting parameters
Author: Sudo, M.
Nagamatsu, T.
Tsukuda, M.
Omura, I.
Appeared in: Microelectronics reliability
Paging: Volume 100-101 () nr. C pages p.
Year: 2019
Contents:
Publisher: Elsevier Ltd
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 474 of 2989 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands