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Journal description
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Details for article 467 of 2989 found articles
| Title: |
B-Spline X-Ray Diffraction Imaging — Rapid non-destructive measurement of die warpage in ball grid array packages |
| Author: |
Cowley, A. Ivankovic, A. Wong, C.S. Bennett, N.S. Danilewsky, A.N. Gonzalez, M. Cherman, V. Vandevelde, B. De Wolf, I. McNally, P.J. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 59 (2016) nr. C pages 9 p. |
| Year: |
2016 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 467 of 2989 found articles
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