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Details for article 351 of 2989 found articles
| Title: |
A remaining useful life prediction method of IGBT based on online status data |
| Author: |
Zhang, Jinli Hu, Jinbao You, Hailong Jia, Renxu Wang, Xiaowen Zhang, Xiaowen |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 121 () nr. C pages p. |
| Year: |
2021 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 351 of 2989 found articles
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