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Details for article 30 of 2989 found articles
| Title: |
A comparison study on electromagnetic susceptibility of current reference circuits with scaling-down technologies and schemes |
| Author: |
Wang, Zhian Li, Binhong Wu, Jianfei Zhao, Wenxin Li, Bo Liu, Hainan Guan, Chongjie Feng, Shiwei Luo, Jiajun Ye, Tianchun |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 114 () nr. C pages p. |
| Year: |
2020 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 30 of 2989 found articles
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