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Details for article 293 of 2989 found articles
| Title: |
A novel methodology to characterize LGA packaged GaN power transistors using a mother/daughter board configuration for the reliability qualification in the mild hybrid applications |
| Author: |
Douzi, Chawki Kadi, Moncef Dherbecourt, Pascal Besserour, Mohamed Akram Joubert, Eric Fouquet, François |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 138 () nr. C pages p. |
| Year: |
2022 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 293 of 2989 found articles
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