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Journal description
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Details for article 216 of 3017 found articles
| Title: |
Analyzing the impact of radiation-induced failures in flash-based APSoC with and without fault tolerance techniques at CERN environment |
| Author: |
Tambara, L.A. Chielle, E. Kastensmidt, F.L. Tsiligiannis, G. Danzeca, S. Brugger, M. Masi, A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 76-77 (2017) nr. C pages 640-643 |
| Year: |
2017 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 216 of 3017 found articles
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