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Journal description
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Details for article 164 of 2989 found articles
| Title: |
Analysis of electromigration failure of nano-interconnects through a combination of modeling and experimental methods |
| Author: |
Ceric, H. Zahedmanesh, H. Croes, K. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 100-101 () nr. C pages p. |
| Year: |
2019 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 164 of 2989 found articles
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