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Journal description
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Details for article 944 of 1093 found articles
| Title: |
Simultaneous IC-internal voltage and current measurements via a multi lever Scanning Force Microscope |
| Author: |
Hartmann, C. Weber, R. Mertin, W. Kubalek, E. Müller, A.-D. Hietschold, M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 9-11 pages 4 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 944 of 1093 found articles
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