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Details for article 837 of 1093 found articles
| Title: |
Reduction of the acquisition time for CMOS time-resolved photon emission by optimized IR detection |
| Author: |
Ispasoiu, Radu Crawford, Tom Johnston, Brian Shaw, Chris Kasapi, Steven Goertz, Jason Rinaudo, Olivier Ouimet, Peter |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 46 (2006) nr. 9-11 pages 4 p. |
| Year: |
2006 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 837 of 1093 found articles
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