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Journal description
All volumes of the corresponding journal
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Details for article 727 of 1093 found articles
| Title: |
NBTI degradation effect on advanced-process 45nm high-k PMOSFETs with geometric and process variations |
| Author: |
Hatta, S.F. Wan Muhamad Soin, N. Hadi, D. Abd Zhang, J.F. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 50 (2010) nr. 9-11 pages 7 p. |
| Year: |
2010 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 727 of 1093 found articles
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