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Journal description
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Details for article 7 of 1093 found articles
| Title: |
Accelerated lifetime test of RF-MEMS switches under ESD stress |
| Author: |
Ruan, J. Nolhier, N. Papaioannou, G.J. Trémouilles, D. Puyal, V. Villeneuve, C. Idda, T. Coccetti, F. Plana, R. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 49 (2009) nr. 9-11 pages 4 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 7 of 1093 found articles
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