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Details for article 652 of 1093 found articles
| Title: |
Lift-out techniques coupled with advanced TEM characterization methods for electrical failure analysis |
| Author: |
Bicaı̈is-Lépinay, N. André, F. Pantel, R. Jullian, S. Margain, A. Kwakman, L.F.Tz. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 9-11 pages 6 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 652 of 1093 found articles
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