|
| << previous | next >> |
Journal description
All volumes of the corresponding journal
All issues of the corresponding volume
All articles of the corresponding issues
Details for article 641 of 1093 found articles
| Title: |
Laser THz emission microscope as a novel tool for LSI failure analysis |
| Author: |
Yamashita, Masatsugu Otani, Chiko Kim, Sunmi Murakami, Hironaru Tonouchi, Masayoshi Matsumoto, Toru Midoh, Yoshihiro Miura, Katsuyoshi Nakamae, Koji Nikawa, Kiyoshi |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 49 (2009) nr. 9-11 pages 11 p. |
| Year: |
2009 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 641 of 1093 found articles
| << previous | next >> |