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Journal description
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Details for article 616 of 1093 found articles
| Title: |
Investigation of low temperature SRAM and ROM failures to enable the replacement of cold test insertion by room temperature test |
| Author: |
Müller, Stefan Egger, Peter |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 9-11 pages 4 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 616 of 1093 found articles
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