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Journal description
All volumes of the corresponding journal
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All articles of the corresponding issues
Details for article 515 of 1093 found articles
| Title: |
High-field step-stress and long term stability of PHEMTs with different gate and recess lengths |
| Author: |
Cova, P. Menozzi, R. Dammann, M. Feltgen, T. Jantz, W. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 42 (2002) nr. 9-11 pages 6 p. |
| Year: |
2002 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 515 of 1093 found articles
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