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Journal description
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Details for article 480 of 1093 found articles
| Title: |
Field-effect control of breakdown paths in HfO2 based MIM structures |
| Author: |
Saura, X. Lian, X. Jiménez, D. Miranda, E. Borrisé, X. Campabadal, F. Suñé, J. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 53 (2013) nr. 9-11 pages 5 p. |
| Year: |
2013 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 480 of 1093 found articles
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