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Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 μm CMOS bipolar transistors |
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Titel: |
Dc and low frequency noise analysis of hot-carrier induced degradation of low complexity 0.13 μm CMOS bipolar transistors |
Auteur: |
Benoit, P. Raoult, J. Delseny, C. Pascal, F. Snadny, L. Vildeuil, J.-C. Marin, M. Martinet, B. Cottin, D. Noblanc, O. |
Verschenen in: |
Microelectronics reliability |
Paginering: |
Jaargang 45 (2005) nr. 9-11 pagina's 7 p. |
Jaar: |
2005 |
Inhoud: |
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Uitgever: |
Elsevier Ltd |
Bronbestand: |
Elektronische Wetenschappelijke Tijdschriften |
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