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Journal description
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Details for article 155 of 1093 found articles
| Title: |
Backend dielectric breakdown dependence on linewidth and pattern density |
| Author: |
Milor, Linda Hong, Changsoo |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 47 (2007) nr. 9-11 pages 5 p. |
| Year: |
2007 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 155 of 1093 found articles
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