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Journal description
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Details for article 397 of 551 found articles
| Title: |
Radiation sensitivity of junctionless double-gate 6T SRAM cells investigated by 3-D numerical simulation |
| Author: |
Munteanu, D. Autran, J.L. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 54 (2014) nr. 9-10 pages 5 p. |
| Year: |
2014 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 397 of 551 found articles
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