Digital Library
Close Browse articles from a journal
 
<< previous    next >>
     Journal description
       All volumes of the corresponding journal
         All issues of the corresponding volume
           All articles of the corresponding issues
                                       Details for article 27 of 551 found articles
 
 
  Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs
 
 
Title: Analysis of retention tail distribution induced by scaled shallow trench isolation for high densityDRAMs
Author: Pil Kim, Young
Jun Jin, Beom
Wook Park, Young
Tae Moon, Joo
Kim, Sang U.
Appeared in: Microelectronics reliability
Paging: Volume 41 (2001) nr. 9-10 pages 5 p.
Year: 2001
Contents:
Publisher: Published by Elsevier B.V.
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 27 of 551 found articles
 
<< previous    next >>
 
 Koninklijke Bibliotheek - National Library of the Netherlands