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Journal description
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Details for article 571 of 572 found articles
| Title: |
Workload and temperature dependent evaluation of BTI-induced lifetime degradation in digital circuits |
| Author: |
Eghbalkhah, Behzad Kamal, Mehdi Afzali-Kusha, Hassan Afzali-Kusha, Ali Ghaznavi-Ghoushchi, Mohammad Bagher Pedram, Massoud |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 8 pages 11 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 571 of 572 found articles
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