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Journal description
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Details for article 36 of 572 found articles
| Title: |
An alternate and simpler method for finding the field-dependent defect density of SiO2 films using MOS capacitor devices |
| Author: |
Bhan, R.K. Mathur, P.C. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 34 (1994) nr. 8 pages 4 p. |
| Year: |
1994 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 36 of 572 found articles
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