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Journal description
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Details for article 166 of 572 found articles
| Title: |
Degradation mapping in high power IGBT modules using four-point probing |
| Author: |
Pedersen, Kristian Bonderup Østergaard, Lotte Haxen Ghimire, Pramod Popok, Vladimir Pedersen, Kjeld |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 55 (2015) nr. 8 pages 9 p. |
| Year: |
2015 |
| Contents: | |
| Publisher: |
Elsevier Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 166 of 572 found articles
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