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Journal description
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Details for article 106 of 572 found articles
| Title: |
Bounds for reliability of k-within connected-(r, s)-out-of-(m, n) failure systems |
| Author: |
Makri, F.S. Psillakis, Z.M. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 37 (1997) nr. 8 pages 8 p. |
| Year: |
1997 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 106 of 572 found articles
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