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Journal description
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Details for article 410 of 425 found articles
| Title: |
Threshold energies in the light emission characteristics of silicon MOS tunnel diodes |
| Author: |
Asli, N. Vexler, M.I. Shulekin, A.F. Yoder, P.D. Grekhov, I.V. Seegebrecht, P. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 41 (2001) nr. 7 pages 6 p. |
| Year: |
2001 |
| Contents: | |
| Publisher: |
Elsevier Science Ltd |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 410 of 425 found articles
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