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Journal description
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Details for article 82 of 85 found articles
| Title: |
The time of “guessing” your failure time distribution is over! |
| Author: |
Croes, K. Manca, J.V. De Ceuninck, W. De Schepper, L. Molenberghs, G. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 6-8 pages 5 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 82 of 85 found articles
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