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Journal description
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Details for article 47 of 85 found articles
| Title: |
Hot carrier degradation mechanisms in sub-micron p channel MOSFETs: Impact on low frequency (1/f) noise behaviour |
| Author: |
Sheehan, E. Hurley, P.K. Mathewson, A. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 38 (1998) nr. 6-8 pages 6 p. |
| Year: |
1998 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 47 of 85 found articles
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