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Journal description
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Details for article 17 of 127 found articles
| Title: |
A universal reliability prediction model for SMD integrated circuits based on field failures |
| Author: |
Kervarrec, G. Monfort, M.L. Riaudel, A. Klimonda, P.Y. Coudrin, J.R. Le Razavet, D. Boulaire, J.Y. Jeanpierre, P. Perie, D. Meister, R. Casassa, S. Haumont, J.L. Liagre, B. |
| Appeared in: |
Microelectronics reliability |
| Paging: | Volume 39 (1999) nr. 6-7 pages 7 p. |
| Year: |
1999 |
| Contents: | |
| Publisher: |
Published by Elsevier B.V. |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 17 of 127 found articles
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